How Are Magnetic Lenses in SEMs Redefining Precision in Semiconductor Metrology?
Advanced Magnetic Technology in SEMs: Enhancing Semiconductor Metrology As semiconductor devices continue to shrink and grow more complex, the demand for cutting-edge metrology tools has never been greater. Scanning Electron Microscopes (SEMs), which play a vital role in modern semiconductor processes, rely on magnetic technology to deliver high-resolution imaging and detailed analysis. The Role of …